Characterization of microstructure

Scanning electron microscope analyses, following testing station instruction 30 – 34:

  • polished surface area
  • magnification up to 2000fold
  • EDX-analyses
  • line scans
  • secundary electron images
  • mappings
Microprobe analyses following testing station instruction 30 – 34

Stereomicroscopic images

Contact: Dipl.-Ing. Gero Stolle

Phone: +49 3521 463530

Contact: Dipl.-Ing. Wolfgang Krahl

Phone: +49 3521 463527